Slip correction measurements of certified PSL nanoparticles using a nanometer differential mobility analyzer (Nano-DMA) for Knudsen number from 0.5 to ... Institute of Standards and Technology

by Jung Hyeun Kim, George W. Mulholland, Scott R. Kukuck, David Y.H. Pui

This digital document is an article from Journal of Research of the National Institute of Standards and Technology, published by National Institute of Standards and Technology on January 1, 2005. The length of the article is 14347 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker... (read more)

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